1. Equipment name:

SCANNING PROBE MICROSCOPE, JEOL JSPM 4210: ATOMIC FORCE MICROSCOPE (AFM)

and SCANNING TUNNELING MICROSCOPE (STM)
Catalog name: JEOL JSPM 4210
Producer: JEOL Ltd. Japan
Equipment type: Strategic equipment

             AFM- STM: JSPM 4210

2. Equipment date: 2004.

3. Technical characteristics / performances:
• Atomic Force Microscopy operates in AC (tapping) mode, Contact mode, Non-contact mode
• Special scanning modes: magnetic AFM, conductive AFM
• Nano mechanical properties (nano-mechanics) and force curves
• Scanning Tunneling Microscopy
• Imaging mode at atomic and nano size resolution;
• fluid cell for imaging in fluid environment
• narrow area scanning

Samples characteristics:
• Sample size: 20 X 50 X 2.5 mm
• Scanning maximum values: - maximum scanned area 20 μm x 20 μm;
• maximum probe displacement 4 μm.

Specific Soft:

• Win SPM scanning – used for images scanning
• Win SPM processing –used for image processing and measurements.
• The soft allows sample surface analysis such: roughness, height, cross profiles, particles distribution.

4. Domains of activity:
• Surface analysis of advanced nanobiomaterials
• Imaging of various types of nanoparticles in thin films
• Surface characteristics of scaffolds: roughness,
• Cross profiles, particles distribution and nano-mechanics
• Cell membranes interactions with drugs
• Morphology of self assemblies of biomolecules
• Morphology and properties of biocomposites
• Quality of materials, imaging facilities

5. Contact persons:
Conf. Univ. Dr. Aurora Mocanu, aurora.mocanu@ubbcluj.ro
Dr. Ing. Petean Ioan, Research Assistant.