MICROSCOPE, JEOL JSPM 4210: ATOMIC FORCE MICROSCOPE (AFM)
TUNNELING MICROSCOPE (STM)
Catalog name: JEOL JSPM 4210
Producer: JEOL Ltd. Japan
Equipment type: Strategic equipment
AFM- STM: JSPM 4210
2. Equipment date: 2004.
3. Technical characteristics / performances:
Atomic Force Microscopy operates in AC (tapping) mode, Contact mode,
Special scanning modes: magnetic AFM, conductive AFM
Nano mechanical properties (nano-mechanics) and force curves
Scanning Tunneling Microscopy
Imaging mode at atomic and nano size resolution;
fluid cell for imaging in fluid environment
narrow area scanning
Sample size: 20 X 50 X 2.5 mm
Scanning maximum values: - maximum scanned area 20 μm x 20 μm;
maximum probe displacement 4 μm.
Win SPM scanning used for images scanning
Win SPM processing used for image processing and measurements.
The soft allows sample surface analysis such: roughness, height, cross
profiles, particles distribution.
4. Domains of activity:
Surface analysis of advanced nanobiomaterials
Imaging of various types of nanoparticles in thin films
Surface characteristics of scaffolds: roughness,
Cross profiles, particles distribution and nano-mechanics
Cell membranes interactions with drugs
Morphology of self assemblies of biomolecules
Morphology and properties of biocomposites
Quality of materials, imaging facilities
5. Contact persons:
Conf. Univ. Dr. Aurora Mocanu,
Dr. Ing. Petean Ioan, Research Assistant.